Iterative identification of fault-prone binaries using in-process metricsOct 1, 2008·Lucas Layman,Gunnar Kudrjavets,Nachiappan Nagappan· 0 min read URL Cite DOITypeConference paperPublicationProceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement - ESEM ‘08publicationsLast updated on Oct 1, 2008Churn Code Churn Fault Prediction Mypubs Regression Statistical Models ← Evaluation of Systems Engineering Methods, Processes and Tools on Department of Defense and Intelligence Community Programs Jan 1, 2009Mining software effort data: A preliminary analysis of Visual Studio Team System Data May 1, 2008 →